Physics

Greg Taft

Academic Degrees:
  • Ph.D., Washington State University (1997)
  • M.S., Washington State University (1994)
  • B.A., Saint John's University (1992)
Research Areas/Interest

Femtosecond lasers and their use in understanding ultrafast processes in materials, femtosecond pump-probe spectroscopy, nonlinear optics.

Select Publications:

B. Crossman, G. Taft, “  Transient transmission oscillations in doped and undoped lithium niobate induced by near-infrared femtosecond pulses,”  J. Mater. Res. doi:10.1557/jmr.2018.414 (2018).

C. G. Durfee, T. Storz, J. Garlick, S. Hill, J. A. Squier, M. Kirchner, G. Taft, K. Shea, H. Kapteyn, M. Murnane, S. Backus, "  Direct diode-pumped Kerr-lens mode-locked Ti:sapphire laser,"  Opt. Express20,13677 (2012).

G. J. Taft, M. T. Newby, J. J. Hrebik, M. Onellion, T. F. George, D. Szentesi, S. Szatmari, and L. Nanai, " Ultrafast dynamic reflectivity of vanadium pentoxide,"  J. Mater. Res.23, 2 (2008).

M. L. Schneider, M. Onellion, X. X. Xi, Xianghui Zeng, Arsen Soukiassian, P. Omernik, and G. Taft, "Electron dynamics in metallic and spin-glass cuprates,"  Phys. Rev. B70, 012504 (2004).

G. Taft, A. Rundquist, M. M. Murnane, H. C. Kapteyn, K. DeLong, R. Trebino, I. Christov, "  Ultrafast optical waveform measurements using Frequency Resolved Optical Gating,"  Opt. Lett.20, 743 (1995).

Dynamic Reflectivity Measurement

An ultrashort laser "pump" pulse with a duration less than 100 fs (1 x 10  -13 s) energizes charged particles at the surface of a sample, temporarily changing the surface reflectivity.  A lower energy probe pulse reflects from the energized surface after a controllable time delay. The change in the reflected probe light is measured versus the time delay. This helps understand charge dynamics in the sample on ultrashort timescales.

dynamic reflectivity image

Greg Taft, visiting associate professor

SJU PEngl 111
320-363-3390
[email protected]

College of Saint Benedict
Saint John’s University

Jim Crumley
Chair, Physics Department
SJU PEngl 107
Physics Department
320-363-3183